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MTJ p-bits · Mixed-signal circuits

Local interface circuits for MTJ p-bits

Circuit-level contributions to an ongoing collaborative project, focusing on selection circuitry, output restoration, and process-corner simulation.

NanoX Lab · Contributing researcherCollaborative project · In production at TSMC

Circuit-level focus

My contribution to an ongoing MTJ p-bit project includes local circuitry for signal selection and output restoration. The work connects transistor-level circuit design to the interface requirements of a collaborative mixed-signal research effort.

This page presents a local circuit schematic and its simulated output response. I am a contributing researcher on the project, with responsibility for specific circuit and verification tasks.

My contribution

I worked on MUX and inverter circuitry for selecting signals and restoring their outputs for CMOS logic, alongside the project’s modeling and mixed-signal verification work. The examples here focus on the schematic and transient-simulation portions of that contribution.

Local selection and output-restoration circuit schematic
A local transistor-level circuit used in the interface work. The figure shows the supplied circuit excerpt, including its output buffering and load.

The circuit work involves checking signal propagation through the local selection/restoration path and examining its output under the available process-corner models. The scope of these checks is the local interface circuit.

Process-corner transient simulation

The supplied transient plot overlays the output response for nominal, FF, SS, FS, and SF process corners. The traces show switching between approximately 0 V and 1.8 V, with visible differences around the rising and falling transitions.

Output transient simulation at nominal, FF, SS, FS, and SF process corners
Local-circuit output transient across five process corners. These are simulation traces; this figure does not establish a quantitative delay specification or a full temperature-and-supply sweep.
Guide to inspecting logic levels and edge spread in the five supplied corner traces
Reading guide for the local-circuit waveform: compare output levels and the spread around both transitions. This is an explanatory diagram, not an additional simulation result.

The useful comparison is whether the output levels and transitions remain consistent across the shown process models. The cropped trace supports a qualitative inspection; extracting propagation delay would require a time scale and corresponding input reference.

These results document local circuit behavior during design and verification. The research project remains in progress.

Project scope

The figures on this page are selected local-circuit excerpts. The collaborative project is in production at TSMC; the results shown here are schematic-level simulations, not silicon measurements.